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Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
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Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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2. 
Cover image for Wide-band-gap semiconductors proceedings of the Seventh Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 8-12 June 1992
Wide-band-gap semiconductors proceedings of the Seventh Trieste ICTP-IUPAP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 8-12 June 1992
Author 
Trieste ICTP-IUPAP Semiconductor Symposium (7th : 1992) Van de Walle, Chris Gilbert.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444815736
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3. 
Cover image for Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy
Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy
Author 
Perkowitz, S.
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ScienceDirect http://www.sciencedirect.com/science/book/9780125507707
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