Switch to list view
Switch to thumbnail view
Select an Action
5 Results Found Subscribe to search results
00000DEFAULT
Print
1. 
Cover image for IEEE spectrum.
IEEE spectrum.
Author 
Institute of Electrical and Electronics Engineers.
Preferred Shelf Number 
ALFABETİK V.1967 OCT-1968 JUN
Format: 
Availability 
Beytepe Library~7 ~0
Available:
Copies:
2. 
Cover image for Micromechanics and MEMS classic and seminal papers to 1990
Micromechanics and MEMS classic and seminal papers to 1990
Author 
Trimmer, W. Institute of Electrical and Electronics Engineers.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273520
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Engineering networks for synchronization, CCS 7, and ISDN standards, protocols, planning, and testing
Engineering networks for synchronization, CCS 7, and ISDN standards, protocols, planning, and testing
Author 
Bhatnagar, P. K., 1948- IEEE Communications Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273657
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Semiconductor memories technology, testing, and reliability
Semiconductor memories technology, testing, and reliability
Author 
Sharma, Ashok K. IEEE Solid-State Circuits Council.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Standard for use of the International System of Units (SI) : the modern metric system
Standard for use of the International System of Units (SI) : the modern metric system
Author 
American Society for Testing and Materials.
Preferred Shelf Number 
QC91 S82 1997
Format: 
Availability 
Beytepe Library~1
Available:
Copies: