Switch to list view
Switch to thumbnail view
Select an Action
7 Results Found Subscribe to search results
0000000DEFAULT
Print
1. 
Cover image for Magnetism From Fundamentals to Nanoscale Dynamics
Magnetism From Fundamentals to Nanoscale Dynamics
Author 
Stöhr, Joachim. author. Siegmann, Hans Christoph. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-30283-4
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Surface-Enhanced Raman Scattering Physics and Applications
Surface-Enhanced Raman Scattering Physics and Applications
Author 
Kneipp, Katrin. editor. Moskovits, Martin. editor. Kneipp, Harald. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-33567-6
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Applied Scanning Probe Methods III Characterization
Applied Scanning Probe Methods III Characterization
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138285
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Applied Scanning Probe Methods IV Industrial Applications
Applied Scanning Probe Methods IV Industrial Applications
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b138289
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques
Author 
Bhushan, Bharat. editor. Fuchs, Harald. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b139097
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Nanoscale Transistors Device Physics, Modeling and Simulation
Nanoscale Transistors Device Physics, Modeling and Simulation
Author 
Lundstrom, Mark S. author. Guo, Jing. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-28003-0
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents
Author 
Foster, Adam. author. Hofer, Werner. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-37231-8
Format: 
Availability 
Online Library~1
Available:
Copies: