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Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
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2. 
Cover image for Metrology in industry the key for quality
Metrology in industry the key for quality
Author 
Collège français de métrologie. Wiley InterScience (Online service)
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Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html
John Wiley http://dx.doi.org/10.1002/9780470612125
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3. 
Cover image for Computer network time synchronization the network time protocol
Computer network time synchronization the network time protocol
Author 
Mills, David L.
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