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1. 
Cover image for Semiconductors and semimetals.
Semiconductors and semimetals.
Author 
Willardson, Robert K. ed. Beer, Albert C., ed. Weber, Eicke R., ed. Plekhanov, Vladimir G., ed.
Preferred Shelf Number 
QC 612.S4 W5 V.1
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2. 
Cover image for Integration of Functional Oxides with Semiconductors
Integration of Functional Oxides with Semiconductors
Author 
Demkov, Alexander A. author. Posadas, Agham B. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-1-4614-9320-4
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3. 
Cover image for Gallium arsenide IC applications handbook
Gallium arsenide IC applications handbook
Author 
Fisher, Dennis G., Ph. D. Bahl, I. J.
Preferred Shelf Number 
ONLINE
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ScienceDirect http://www.sciencedirect.com/science/book/9780122577352
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4. 
Cover image for Quantum theory of molecules and solids
Quantum theory of molecules and solids
Author 
Slater, John Clarke, 1900-
Preferred Shelf Number 
QC 174.1 S56 1963-67 V.1
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5. 
Cover image for Novel advances in microsystems technologies and their applications
Novel advances in microsystems technologies and their applications
Author 
Francis, Laurent A., editor. Iniewski, Krzysztof, 1960- editor.
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6. 
Cover image for Fundamentals of silicon carbide technology : growth, characterization, devices, and applications
Fundamentals of silicon carbide technology : growth, characterization, devices, and applications
Author 
Kimoto, Tsunenobu, 1963- author. Cooper, James A., 1946- author.
Preferred Shelf Number 
ONLINE(341501.1)
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781118313534
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7. 
Cover image for Silicon-On-Insulator (SOI) Technology Manufacture and Applications.
Silicon-On-Insulator (SOI) Technology Manufacture and Applications.
Author 
Kononchuk, O. Nguyen, B.-Y.
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ONLINE(355710.1)
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ScienceDirect http://www.sciencedirect.com/science/book/9780857095268
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8. 
Cover image for High performance silicon imaging : fundamentals and applications CMOS and CCD sensors
High performance silicon imaging : fundamentals and applications CMOS and CCD sensors
Author 
Durini, Daniel, editor.
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ONLINE(355761.1)
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ScienceDirect http://www.sciencedirect.com/science/book/9780857095985
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9. 
Cover image for Beyond-CMOS Nanodevices 1
Beyond-CMOS Nanodevices 1
Author 
Balestra, Francis.
Preferred Shelf Number 
ONLINE(342103.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1706877
ebrary http://site.ebrary.com/id/10879744
John Wiley http://dx.doi.org/10.1002/9781118984772
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10. 
Cover image for Beyond-CMOS nanodevices 2
Beyond-CMOS nanodevices 2
Author 
Balestra, Francis, editor.
Preferred Shelf Number 
ONLINE(342107.1)
Electronic Access 
ebrary An electronic book accessible through the World Wide Web; click to view
John Wiley http://dx.doi.org/10.1002/9781118985137
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11. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author 
Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.
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ONLINE(342881.1)
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12. 
Cover image for Internal Photoemission Spectroscopy Fundamentals and Recent Advances.
Internal Photoemission Spectroscopy Fundamentals and Recent Advances.
Author 
Afanas'ev, Valeri V.
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ONLINE(355940.1)
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ScienceDirect http://www.sciencedirect.com/science/book/9780080999296
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13. 
Cover image for Nanostructured semiconductor oxides for the next generation of electronics and functional devices : properties and applications
Nanostructured semiconductor oxides for the next generation of electronics and functional devices : properties and applications
Author 
Zhuiykov, Serge, author.
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ONLINE(355966.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9781782422204
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14. 
Cover image for Integrated power devices and TCAD simulation
Integrated power devices and TCAD simulation
Author 
Fu, Yue (Electrical engineer), author. Li, Zhanming, author. Ng, Wai Tung, author. Sin, Johnny K. O., author.
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ONLINE(356761.1)
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15. 
Cover image for Electrical overstress (EOS) : devices, circuits, and systems
Electrical overstress (EOS) : devices, circuits, and systems
Author 
Voldman, Steven H.
Preferred Shelf Number 
TK7871.852 V648 2014
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16. 
Cover image for Ternary alloys based on II-IV semiconductor compounds
Ternary alloys based on II-IV semiconductor compounds
Author 
Tomashyk, Vasyl. Feychuk, Petro. Shcherbak, Larysa.
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17. 
Cover image for Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
Author 
Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-02378-6
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18. 
Cover image for ESD : analog circuits and design
ESD : analog circuits and design
Author 
Voldman, Steven H.
Preferred Shelf Number 
ONLINE(341679.1)
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118701409
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19. 
Cover image for Wireless power transfer via radiowaves
Wireless power transfer via radiowaves
Author 
Shinohara, Naoki, 1968- author.
Preferred Shelf Number 
ONLINE(341917.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1599324
John Wiley http://dx.doi.org/10.1002/9781118863008
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20. 
Cover image for Metal chalcogenide nanostructures for renewable energy applications
Metal chalcogenide nanostructures for renewable energy applications
Author 
Qurashi, Ahsanulhaq, editor.
Preferred Shelf Number 
ONLINE(342154.1)
Electronic Access 
Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1866801
John Wiley http://dx.doi.org/10.1002/9781119008934
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21. 
Cover image for Bias Temperature Instability for Devices and Circuits
Bias Temperature Instability for Devices and Circuits
Author 
Grasser, Tibor. editor. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-1-4614-7909-3
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22. 
Cover image for Energy-Efficient Fault-Tolerant Systems
Energy-Efficient Fault-Tolerant Systems
Author 
Mathew, Jimson. editor. Shafik, Rishad A. editor. Pradhan, Dhiraj K. editor. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-1-4614-4193-9
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23. 
Cover image for Exploring Memory Hierarchy Design with Emerging Memory Technologies
Exploring Memory Hierarchy Design with Emerging Memory Technologies
Author 
Sun, Guangyu. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-00681-9
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24. 
Cover image for Trace-Based Post-Silicon Validation for VLSI Circuits
Trace-Based Post-Silicon Validation for VLSI Circuits
Author 
Liu, Xiao. author. Xu, Qiang. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
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https://doi.org/10.1007/978-3-319-00533-1
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25. 
Cover image for MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch
Author 
Srivastava, Viranjay M. author. Singh, Ghanshyam. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-01165-3
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26. 
Cover image for Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Author 
Richter, Detlev. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-94-007-6082-0
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27. 
Cover image for Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Author 
Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-7663-0
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28. 
Cover image for Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Feature Profile Evolution in Plasma Processing Using On-wafer Monitoring System
Author 
Samukawa, Seiji. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-4-431-54795-2
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29. 
Cover image for Organic photovoltaics : materials, device physics, and manufacturing technologies
Organic photovoltaics : materials, device physics, and manufacturing technologies
Author 
Brabec, C. J. (Christoph J.), 1966- editor. Scherf, Ullrich, editor. Dʹi͡akonov, Vladimir A., editor. Angmo, Dechan.
Preferred Shelf Number 
ONLINE(342204.1)
Electronic Access 
ebrary http://alltitles.ebrary.com/Doc?id=10842269
John Wiley http://dx.doi.org/10.1002/9783527656912
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30. 
Cover image for Interatomic bonding in solids fundamentals, simulation, applications
Interatomic bonding in solids fundamentals, simulation, applications
Author 
Levitin, Valim.
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ONLINE(342212.1)
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John Wiley http://dx.doi.org/10.1002/9783527671557
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31. 
Cover image for Systematische Beurteilung technischer Schadensflle
Systematische Beurteilung technischer Schadensflle
Author 
Pohl, Michael. Lange, Günter.
Preferred Shelf Number 
ONLINE(342231.1)
Electronic Access 
ebrary http://alltitles.ebrary.com/Doc?id=10839246
John Wiley http://dx.doi.org/10.1002/9783527683161
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32. 
Cover image for Fundamentals of solid-state lighting : LEDs, OLEDs, and their applications in illumination and displays
Fundamentals of solid-state lighting : LEDs, OLEDs, and their applications in illumination and displays
Author 
Khanna, Vinod Kumar, 1952- author.
Preferred Shelf Number 
ONLINE(356980.1)
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33. 
Cover image for Katıhal elektroniği devre elemanları
Katıhal elektroniği devre elemanları
Author 
Streetman, Ben G. Banerjee, Sanjay Kumar. Merdan, Mustafa.
Preferred Shelf Number 
TK7871.85 S771 2014
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34. 
Cover image for Semiconductor Technologies in the Era of Electronics
Semiconductor Technologies in the Era of Electronics
Author 
Kang, Yong Hoon. author. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-94-017-8768-0
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