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1. 
Cover image for Test Generation of Crosstalk Delay Faults in VLSI Circuits
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author 
Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-2493-2
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2. 
Cover image for Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
Next Generation and Advanced Network Reliability Analysis Using Markov Models and Software Reliability Engineering
Author 
Ali, Syed Riffat. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-01647-0
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3. 
Cover image for From Extractive to Abstractive Summarization: A Journey
From Extractive to Abstractive Summarization: A Journey
Author 
Mehta, Parth. author. (orcid)0000-0002-4509-1298 Majumder, Prasenjit. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-8934-4
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4. 
Cover image for Aviation System Risks and Safety
Aviation System Risks and Safety
Author 
Kuklev E.A. author. Shapkin V.S. author. Filippov V.L. author. Shatrakov Y.G. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-8122-5
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5. 
Cover image for Single-DC-Source Multilevel Inverters
Single-DC-Source Multilevel Inverters
Author 
Vahedi, Hani. author. Trabelsi, Mohamed. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-15253-6
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