Cover image for Aberration-corrected analytical transmission electron microscopy
Title:
Aberration-corrected analytical transmission electron microscopy
Author:
Brydson, Rik, editor, author.
ISBN:
9781119978855

9781119978848

9781119979906

9781119979913
Physical Description:
1 online resource (xv, 280 pages, 8 unnumbered pages of color plates) : illustrations (some color)
General Note:
"Published in association with the Royal Microscopical Society."
Abstract:
"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- Provided by publisher.

"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- Provided by publisher.
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E-Book 318971-1001 ONLINE(318971.1)
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