Title:
Aberration-corrected analytical transmission electron microscopy
Author:
Brydson, Rik, editor, author.
ISBN:
9781119978855
9781119978848
9781119979906
9781119979913
Physical Description:
1 online resource (xv, 280 pages, 8 unnumbered pages of color plates) : illustrations (some color)
General Note:
"Published in association with the Royal Microscopical Society."
Abstract:
"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- Provided by publisher.
"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- Provided by publisher.
Added Author:
Electronic Access:
Connect to MyiLibrary resource.Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=693217
ebrary http://site.ebrary.com/id/10488537
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=509882
John Wiley http://dx.doi.org/10.1002/9781119978848
Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
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Searching... | E-Book | 318971-1001 | ONLINE(318971.1) | Searching... | Searching... |