Atomic force microscopy in process engineering introduction to AFM for improved processes and products

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Title:

Author:

Bowen, W. Richard.

ISBN:

9780080949574

9781856175173

Edition:

1st ed.

Publication Information:

Oxford ; Burlington, MA : Butterworth-Heinemann, c2009.

Physical Description:

1 online resource (xvi, 283 p.) : ill.

Series:

Butterworth-Heinemann/IChemE series

Series Title:

Butterworth-Heinemann/IChemE series

Subject Term:

Added Author:

Electronic Access:

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	145196-2001	ONLINE	Searching... Unknown	Searching... Unavailable