Cover image for Technology Enhanced Assessment 21st International Conference, TEA 2018, Amsterdam, The Netherlands, December 10–11, 2018, Revised Selected Papers
Title:
Technology Enhanced Assessment 21st International Conference, TEA 2018, Amsterdam, The Netherlands, December 10–11, 2018, Revised Selected Papers
Author:
Draaijer, Silvester. editor. (orcid)0000-0003-4230-7740
ISBN:
9783030252649
Edition:
1st ed. 2019.
Physical Description:
X, 233 p. 73 illus., 35 illus. in color. online resource.
Series:
Communications in Computer and Information Science, 1014
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