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1. 
Cover image for From scientific instrument to industrial machine Coping with architectural stress in embedded systems
From scientific instrument to industrial machine Coping with architectural stress in embedded systems
Author 
Doornbos, Richard. editor. van Loo, Sjir. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-4147-8
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2. 
Cover image for Wireless Technology Applications, Management, and Security
Wireless Technology Applications, Management, and Security
Author 
Powell, Steven. editor. Shim, J.P. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-71787-6
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3. 
Cover image for Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Author 
Singhee, Amith. author. Rutenbar, Rob A. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3100-6
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4. 
Cover image for Languages for Embedded Systems and their Applications Selected Contributions on Specification, Design, and Verification from FDL’08
Languages for Embedded Systems and their Applications Selected Contributions on Specification, Design, and Verification from FDL’08
Author 
Radetzki, Martin. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-9714-0
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