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Cover image for From scientific instrument to industrial machine Coping with architectural stress in embedded systems
From scientific instrument to industrial machine Coping with architectural stress in embedded systems
Author 
Doornbos, Richard. editor. van Loo, Sjir. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-94-007-4147-8
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2. 
Cover image for Scalable Network Monitoring in High Speed Networks
Scalable Network Monitoring in High Speed Networks
Author 
Choi, Baek-Young. author. Zhang, Zhi-Li. author. Du, David Hung-Chang. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0119-3
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3. 
Cover image for Control and Automation International Conference, CA 2009, Held as Part of the Future Generation Information Technology Conference, CA 2009, Jeju Island, Korea, December 10-12, 2009.Proceedings
Control and Automation International Conference, CA 2009, Held as Part of the Future Generation Information Technology Conference, CA 2009, Jeju Island, Korea, December 10-12, 2009.Proceedings
Author 
Ślęzak, Dominik. editor. Kim, Tai-hoon. editor. Stoica, Adrian. editor. Kang, Byeong-Ho. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-10741-2
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4. 
Cover image for Performance Evaluation and Benchmarking of Intelligent Systems
Performance Evaluation and Benchmarking of Intelligent Systems
Author 
Madhavan, Raj. editor. Tunstel, Edward. editor. Messina, Elena. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0492-8
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