Switch to list view
Switch to thumbnail view
Select an Action
5 Results Found Subscribe to search results
00000DEFAULT
Print
1. 
Cover image for Testing Software and Systems 31st IFIP WG 6.1 International Conference, ICTSS 2019, Paris, France, October 15–17, 2019, Proceedings
Testing Software and Systems 31st IFIP WG 6.1 International Conference, ICTSS 2019, Paris, France, October 15–17, 2019, Proceedings
Author 
Gaston, Christophe. editor. (orcid)0000-0001-6865-5108 Kosmatov, Nikolai. editor. (orcid)0000-0003-1557-2813 Le Gall, Pascale. editor. (orcid)0000-0002-8955-6835 SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-31280-0
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Theory and Applications of Satisfiability Testing – SAT 2019 22nd International Conference, SAT 2019, Lisbon, Portugal, July 9–12, 2019, Proceedings
Theory and Applications of Satisfiability Testing – SAT 2019 22nd International Conference, SAT 2019, Lisbon, Portugal, July 9–12, 2019, Proceedings
Author 
Janota, Mikoláš. editor. (orcid)0000-0003-3487-784X Lynce, Inês. editor. (orcid)0000-0003-4868-415X SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-24258-9
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Theory and Applications of Satisfiability Testing - SAT 2014 17th International Conference, Held as Part of the Vienna Summer of Logic, VSL 2014, Vienna, Austria, July 14-17, 2014, Proceedings
Theory and Applications of Satisfiability Testing - SAT 2014 17th International Conference, Held as Part of the Vienna Summer of Logic, VSL 2014, Vienna, Austria, July 14-17, 2014, Proceedings
Author 
Sinz, Carsten. editor. Egly, Uwe. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-09284-3
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Interconnect Reliability in Advanced Memory Device Packaging
Interconnect Reliability in Advanced Memory Device Packaging
Author 
Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-031-26708-6
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Computer technology and computer programming new research and strategies
Computer technology and computer programming new research and strategies
Author 
Antonakos, James L.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies: