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1. 
Cover image for ESD failure mechanisms and models
ESD failure mechanisms and models
Author 
Voldman, Steven H. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806
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Online Library~1
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2. 
Cover image for Integrated circuit manufacturability the art of process and design integration
Integrated circuit manufacturability the art of process and design integration
Author 
Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097
Format: 
Availability 
Online Library~1
Available:
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