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1. 
Cover image for Computer Aided Surgery 7th Asian Conference on Computer Aided Surgery, Bangkok, Thailand, August 2011, Proceedings
Computer Aided Surgery 7th Asian Conference on Computer Aided Surgery, Bangkok, Thailand, August 2011, Proceedings
Author 
Dohi, Takeyoshi. editor. Liao, Hongen. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-4-431-54094-6
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2. 
Cover image for VLSI Physical Design: From Graph Partitioning to Timing Closure
VLSI Physical Design: From Graph Partitioning to Timing Closure
Author 
Kahng, Andrew B. author. Lienig, Jens. author. Markov, Igor L. author. Hu, Jin. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9591-6
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3. 
Cover image for Introduction to Mixed-Signal, Embedded Design
Introduction to Mixed-Signal, Embedded Design
Author 
Doboli, Alex. author. Currie, Edward H. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-7446-4
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4. 
Cover image for Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Author 
Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-9725-5
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5. 
Cover image for Quantifying and Exploring the Gap Between FPGAs and ASICs Measuring and Exploring
Quantifying and Exploring the Gap Between FPGAs and ASICs Measuring and Exploring
Author 
Kuon, Ian. author. Rose, Jonathan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0739-4
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6. 
Cover image for Timing Optimization Through Clock Skew Scheduling
Timing Optimization Through Clock Skew Scheduling
Author 
Kourtev, Ivan S. editor. Taskin, Baris. editor. Friedman, Eby G. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-71056-3
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7. 
Cover image for Static Timing Analysis for Nanometer Designs A Practical Approach
Static Timing Analysis for Nanometer Designs A Practical Approach
Author 
Chadha, Rakesh. author. Bhasker, J. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-93820-2
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8. 
Cover image for Power Distribution Networks with On-Chip Decoupling Capacitors
Power Distribution Networks with On-Chip Decoupling Capacitors
Author 
Popovich, Mikhhail. author. Mezhiba, Andrey V. author. Friedman, Eby G. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-71601-5
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9. 
Cover image for Standardized Functional Verification
Standardized Functional Verification
Author 
Wiemann, Alan. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-71733-3
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10. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75728-5
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11. 
Cover image for Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Low-Power High-Level Synthesis for Nanoscale CMOS Circuits
Author 
Patra, Priyardarsan. author. Kougianos, Elias. author. Ranganathan, Nagarajan. author. Mohanty, Saraju P. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-76474-0
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12. 
Cover image for CMOS Current-Mode Circuits for Data Communications
CMOS Current-Mode Circuits for Data Communications
Author 
Yuan, Fei. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-47691-9
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13. 
Cover image for Closing the Power Gap Between ASIC & Custom Tools and Techniques for Low Power Design
Closing the Power Gap Between ASIC & Custom Tools and Techniques for Low Power Design
Author 
Chinnery, David. author. Keutzer, Kurt. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-68953-1
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14. 
Cover image for Dynamics of Microelectromechanical Systems
Dynamics of Microelectromechanical Systems
Author 
Lobontiu, Nicolae. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-68195-5
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15. 
Cover image for Design for Manufacturability and Yield for Nano-Scale CMOS
Design for Manufacturability and Yield for Nano-Scale CMOS
Author 
Chiang, Charles C. author. Kawa, Jamil. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-5188-3
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16. 
Cover image for Leakage in Nanometer CMOS Technologies
Leakage in Nanometer CMOS Technologies
Author 
Narendra, Siva G. author. Chandrakasan, Anantha. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/0-387-28133-9
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17. 
Cover image for A Roadmap for Formal Property Verification
A Roadmap for Formal Property Verification
Author 
DasGupta, Pallab. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-4758-9
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18. 
Cover image for Reuse-Based Methodologies and Tools in the Design of Analog and Mixed-Signal Integrated Circuits
Reuse-Based Methodologies and Tools in the Design of Analog and Mixed-Signal Integrated Circuits
Author 
CASTRO-LÓPEZ, R. author. FERNÁNDEZ, F.V. author. GUERRA-VINUESA, O. author. RODRÍGUEZ-VÁZQUEZ, Á. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-5139-5
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19. 
Cover image for Layoutsynthese elektronischer Schaltungen — Grundlegende Algorithmen für die Entwurfsautomatisierung
Layoutsynthese elektronischer Schaltungen — Grundlegende Algorithmen für die Entwurfsautomatisierung
Author 
Lienig, Jens. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/3-540-29942-4
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20. 
Cover image for Semiconductor Modeling For Simulating Signal, Power, and Electromagnetic Integrity
Semiconductor Modeling For Simulating Signal, Power, and Electromagnetic Integrity
Author 
Leventhal, Roy G. author. Green, Lynne. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b104647
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21. 
Cover image for The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
Author 
Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-34609-0
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22. 
Cover image for Verification Methodology Manual for SystemVerilog
Verification Methodology Manual for SystemVerilog
Author 
Bergeron, Janick. author. Cerny, Eduard. author. Hunter, Alan. author. Nightingale, Andrew. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b135575
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23. 
Cover image for Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility
Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility
Author 
Ben Dhia, Sonia. editor. Ramdani, Mohamed. editor. Sicard, Etienne. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137864
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24. 
Cover image for Integrated System-Level Modeling of Network-on-Chip enabled Multi-Processor Platforms
Integrated System-Level Modeling of Network-on-Chip enabled Multi-Processor Platforms
Author 
Kogel, Tim. author. Leupers, Rainer. author. Meyr, Heinrich. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/1-4020-4826-2
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25. 
Cover image for Advances in Design and Specification Languages for SoCs Selected Contributions from FDL’04
Advances in Design and Specification Languages for SoCs Selected Contributions from FDL’04
Author 
Boulet, Pierre. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/b136935
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26. 
Cover image for New Algorithms, Architectures and Applications for Reconfigurable Computing
New Algorithms, Architectures and Applications for Reconfigurable Computing
Author 
Lysaght, Patrick. editor. Rosenstiel, Wolfgang. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-3128-9
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27. 
Cover image for Taxonomies for the Development and Verification of Digital Systems
Taxonomies for the Development and Verification of Digital Systems
Author 
Bailey, Brian. editor. Martin, Grant. editor. Anderson, Thomas. editor. SpringerLink (Online service)
Preferred Shelf Number 
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Electronic Access 
http://dx.doi.org/10.1007/b104217
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