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1. 
Cover image for Residual Stress Measurement and the Slitting Method
Residual Stress Measurement and the Slitting Method
Author 
Cheng, Weili. author. Finnie, Iain. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-39030-7
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2. 
Cover image for Measurement, Control, and Communication Using IEEE 1588
Measurement, Control, and Communication Using IEEE 1588
Author 
Eidson, John C. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-251-9
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3. 
Cover image for Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
Author 
Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-18682-1
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4. 
Cover image for Systems-Level Packaging for Millimeter-Wave Transceivers
Systems-Level Packaging for Millimeter-Wave Transceivers
Author 
Božanić, Mladen. author. (orcid)0000-0001-9174-0781 Sinha, Saurabh. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-030-14690-0
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