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1. 
Cover image for Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9377-9
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2. 
Cover image for Integrated Circuit Test Engineering Modern Techniques
Integrated Circuit Test Engineering Modern Techniques
Author 
Grout, Ian A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-173-3
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3. 
Cover image for Test and Diagnosis for Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
Author 
Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4419-8297-1
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4. 
Cover image for Test Pattern Generation using Boolean Proof Engines
Test Pattern Generation using Boolean Proof Engines
Author 
Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-2360-5
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5. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-74747-7
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6. 
Cover image for Oscillation-Based Test in Mixed-Signal Circuits
Oscillation-Based Test in Mixed-Signal Circuits
Author 
Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-4020-5315-0
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7. 
Cover image for Non-parametric Tuning of PID Controllers A Modified Relay-Feedback-Test Approach
Non-parametric Tuning of PID Controllers A Modified Relay-Feedback-Test Approach
Author 
Boiko, Igor. author. SpringerLink (Online service)
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ONLINE(330986.1)
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http://dx.doi.org/10.1007/978-1-4471-4465-6
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8. 
Cover image for System-Level Validation High-Level Modeling and Directed Test Generation Techniques
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
Author 
Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)
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ONLINE(331265.1)
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http://dx.doi.org/10.1007/978-1-4614-1359-2
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9. 
Cover image for Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Data
Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Data
Author 
Chikalov, Igor. author. Lozin, Vadim. author. Lozina, Irina. author. Moshkov, Mikhail. author. Nguyen, Hung Son. author.
Preferred Shelf Number 
ONLINE(333195.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-28667-4
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10. 
Cover image for China Satellite Navigation Conference (CSNC) 2013 Proceedings BeiDou/GNSS Navigation Applications • Test & Assessment Technology • User Terminal Technology
China Satellite Navigation Conference (CSNC) 2013 Proceedings BeiDou/GNSS Navigation Applications • Test & Assessment Technology • User Terminal Technology
Author 
Sun, Jiadong. editor. Jiao, Wenhai. editor. Wu, Haitao. editor. Shi, Chuang. editor. SpringerLink (Online service)
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ONLINE(334420.1)
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http://dx.doi.org/10.1007/978-3-642-37398-5
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11. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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ONLINE(335669.1)
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http://dx.doi.org/10.1007/978-90-481-9644-9
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12. 
Cover image for Industrial Process Identification and Control Design Step-test and Relay-experiment-based Methods
Industrial Process Identification and Control Design Step-test and Relay-experiment-based Methods
Author 
Liu, Tao. author. Gao, Furong. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-977-2
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13. 
Cover image for High Quality Test Pattern Generation and Boolean Satisfiability
High Quality Test Pattern Generation and Boolean Satisfiability
Author 
Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-9976-4
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14. 
Cover image for Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Author 
Bou-Sleiman, Sleiman. author. Ismail, Mohammed. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-1-4419-9548-3
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15. 
Cover image for Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Author 
Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-9398-1
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16. 
Cover image for Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Author 
Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-9725-5
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17. 
Cover image for Efficient Test Methodologies for High-Speed Serial Links
Efficient Test Methodologies for High-Speed Serial Links
Author 
Hong, Dongwoo. author. Cheng, Kwang-Ting. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-90-481-3443-4
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18. 
Cover image for RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
Author 
Liu, Ai-Qun. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-0-387-46262-2
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19. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-0928-2
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20. 
Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author 
Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.
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http://dx.doi.org/10.1007/978-1-4419-0938-1
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21. 
Cover image for Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
Author 
Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6488-3
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22. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-8363-1
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23. 
Cover image for Design of Systems on a Chip: Design and Test
Design of Systems on a Chip: Design and Test
Author 
Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-32500-X
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24. 
Cover image for Test- und Prüfungsaufgaben Regelungstechnik 457 durchgerechnete Beispiele mit analytischen, nummerischen und computeralgebraischen Lösungen in MATLAB und MAPLE
Test- und Prüfungsaufgaben Regelungstechnik 457 durchgerechnete Beispiele mit analytischen, nummerischen und computeralgebraischen Lösungen in MATLAB und MAPLE
Author 
Weinmann, Alexander. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-211-37139-8
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25. 
Cover image for Make and Test Projects in Engineering Design Creativity, Engagement and Learning
Make and Test Projects in Engineering Design Creativity, Engagement and Learning
Author 
Samuel, Andrew Emery. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-285-3
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26. 
Cover image for The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
Author 
Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-34609-0
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27. 
Cover image for System-level Test and Validation of Hardware/Software Systems
System-level Test and Validation of Hardware/Software Systems
Author 
Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-145-8
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28. 
Cover image for Introduction to Advanced System-on-Chip Test Design and Optimization
Introduction to Advanced System-on-Chip Test Design and Optimization
Author 
Larsson, Erik. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b135763
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29. 
Cover image for Networks-on-Chips : Theory and Practice
Networks-on-Chips : Theory and Practice
Author 
El-Kharashi, Mohamed Watheq, editor. Elmiligi, Haytham, editor. Gebali, Fayez, editor. Taylor and Francis.
Preferred Shelf Number 
TK5105.546
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