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1. 
Cover image for Pistons and engine testing
Pistons and engine testing
Author 
MAHLE GmbH. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-8348-8662-0
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2. 
Cover image for Multiphysical Testing of Soils and Shales
Multiphysical Testing of Soils and Shales
Author 
Laloui, Lyesse. editor. Ferrari, Alessio. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333583.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-32492-5
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3. 
Cover image for Nondestructive Testing of Materials and Structures
Nondestructive Testing of Materials and Structures
Author 
Büyüköztürk, Oral. author. Taşdemir, Mehmet Ali. author. Güneş, Oğuz. editor. Akkaya, Yılmaz. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335698.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-0723-8
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4. 
Cover image for Non-destructive Testing and Repair of Pipelines
Non-destructive Testing and Repair of Pipelines
Author 
Barkanov, Evgeny N. editor. Dumitrescu, Andrei. editor. Parinov, Ivan A. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-56579-8
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5. 
Cover image for Design and Testing of Digital Microfluidic Biochips
Design and Testing of Digital Microfluidic Biochips
Author 
Zhao, Yang. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331239.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0370-8
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6. 
Cover image for Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Author 
Wunderlich, Hans-Joachim. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-3282-9
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7. 
Cover image for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author 
Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-46547-2
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8. 
Cover image for Advances in Interlaboratory Testing and Evaluation of Bituminous Materials State-of-the-Art Report of the RILEM Technical Committee 206-ATB
Advances in Interlaboratory Testing and Evaluation of Bituminous Materials State-of-the-Art Report of the RILEM Technical Committee 206-ATB
Author 
Partl, Manfred N. editor. Bahia, Hussain U. editor. Canestrari, Francesco. editor. de la Roche, Chantal. editor. Di Benedetto, Hervé. editor.
Preferred Shelf Number 
ONLINE(335888.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-5104-0
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9. 
Cover image for Proceedings of the FISITA 2012 World Automotive Congress Volume 8: Vehicle Design and Testing (II).
Proceedings of the FISITA 2012 World Automotive Congress Volume 8: Vehicle Design and Testing (II).
Author 
SAE-China. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333744.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-33738-3
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10. 
Cover image for Proceedings of the FISITA 2012 World Automotive Congress Volume 7: Vehicle Design and Testing (I).
Proceedings of the FISITA 2012 World Automotive Congress Volume 7: Vehicle Design and Testing (I).
Author 
SAE-China. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333763.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-33835-9
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11. 
Cover image for Finite Element Analysis for Satellite Structures Applications to Their Design, Manufacture and Testing
Finite Element Analysis for Satellite Structures Applications to Their Design, Manufacture and Testing
Author 
Abdelal, Gasser F. author. Abuelfoutouh, Nader. author. Gad, Ahmed H. author. SpringerLink (Online service)
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ONLINE(331031.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4471-4637-7
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12. 
Cover image for Computational Flight Testing Results of the Closing Symposium of the German Research Initiative ComFliTe, Braunschweig, Germany, June 11th-12th, 2012
Computational Flight Testing Results of the Closing Symposium of the German Research Initiative ComFliTe, Braunschweig, Germany, June 11th-12th, 2012
Author 
Kroll, Norbert. editor. Radespiel, Rolf. editor. Burg, Jan Willem. editor. Sørensen, Kaare. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(334689.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-38877-4
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13. 
Cover image for Role of Seismic Testing Facilities in Performance-Based Earthquake Engineering SERIES Workshop
Role of Seismic Testing Facilities in Performance-Based Earthquake Engineering SERIES Workshop
Author 
Fardis, Michael N. editor. Rakicevic, Zoran T. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-1977-4
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14. 
Cover image for The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects
Author 
Grossmann, Günter. editor. Zardini, Christian. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-236-0
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15. 
Cover image for Split Hopkinson (Kolsky) Bar Design, Testing and Applications
Split Hopkinson (Kolsky) Bar Design, Testing and Applications
Author 
Chen, Weinong. author. Song, Bo. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7982-7
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16. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0928-2
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17. 
Cover image for Virtual Testing and Predictive Modeling For Fatigue and Fracture Mechanics Allowables
Virtual Testing and Predictive Modeling For Fatigue and Fracture Mechanics Allowables
Author 
Farahmand, Bahram. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-95924-5
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18. 
Cover image for Modern Testing Techniques for Structural Systems Dynamics and Control
Modern Testing Techniques for Structural Systems Dynamics and Control
Author 
Bursi, Oreste S. editor. Wagg, David. editor. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-3-211-09445-7
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19. 
Cover image for Acoustic Emission Testing Basics for Research - Applications in Civil Engineering
Acoustic Emission Testing Basics for Research - Applications in Civil Engineering
Author 
Grosse, Christian. editor. Ohtsu, Masayasu. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-69972-9
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20. 
Cover image for Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems
Author 
Nicolaidis, Michael. editor. SpringerLink (Online service)
Preferred Shelf Number 
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http://dx.doi.org/10.1007/978-1-4419-6993-4
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21. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
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http://dx.doi.org/10.1007/978-1-4020-8363-1
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22. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
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http://dx.doi.org/10.1007/978-0-387-74747-7
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23. 
Cover image for New Methods of Concurrent Checking
New Methods of Concurrent Checking
Author 
Göessel, Michael. author. Ocheretny, Vitaly. author. Sogomonyan, Egor. author. Marienfeld, Daniel. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
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http://dx.doi.org/10.1007/978-1-4020-8420-1
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24. 
Cover image for Gizopoulos / Advances in ElectronicTesting
Gizopoulos / Advances in ElectronicTesting
Author 
Gizopoulos, Dimitris. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/0-387-29409-0
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25. 
Cover image for Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Author 
Maichen, Wolfgang. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
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http://dx.doi.org/10.1007/978-0-387-31419-8
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26. 
Cover image for The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
Author 
Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/0-387-34609-0
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27. 
Cover image for Oscillation-Based Test in Mixed-Signal Circuits
Oscillation-Based Test in Mixed-Signal Circuits
Author 
Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
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http://dx.doi.org/10.1007/1-4020-5315-0
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28. 
Cover image for Introduction to Advanced System-on-Chip Test Design and Optimization
Introduction to Advanced System-on-Chip Test Design and Optimization
Author 
Larsson, Erik. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b135763
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29. 
Cover image for Fault Diagnosis of Analog Integrated Circuits
Fault Diagnosis of Analog Integrated Circuits
Author 
Kabisatpathy, Prithviraj. author. Barua, Alok. author. Sinha, Satyabroto. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b135977
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30. 
Cover image for Data Mining and Diagnosing IC Fails
Data Mining and Diagnosing IC Fails
Author 
Huisman, Leendert M. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b137446
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31. 
Cover image for Sensor technologies for civil infrastructures. Volume 2, Applications in structural health monitoring
Sensor technologies for civil infrastructures. Volume 2, Applications in structural health monitoring
Author 
Wang, M. L., editor. Lynch, Jerome P. (Jerome Peter), editor. Sohn, H. (Hoon), editor.
Preferred Shelf Number 
ONLINE(355767.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9781782422426
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32. 
Cover image for Networks-on-Chips : Theory and Practice
Networks-on-Chips : Theory and Practice
Author 
El-Kharashi, Mohamed Watheq, editor. Elmiligi, Haytham, editor. Gebali, Fayez, editor. Taylor and Francis.
Preferred Shelf Number 
TK5105.546
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33. 
Cover image for Handbook of carbon, graphite, diamond, and fullerenes properties, processing, and applications
Handbook of carbon, graphite, diamond, and fullerenes properties, processing, and applications
Author 
Pierson, Hugh O.
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ScienceDirect http://www.sciencedirect.com/science/book/9780815513391
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