Search Results for Failure analysis (Engineering)

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Subject: Failure analysis (Engineering)

Author

Amiri, Mehdi, author.

(1)

Balakrishnan, N., 1956- author.

(1)

Bloch, Heinz P., 1933-

(1)

Eckert, Richard Bruce, editor.

(1)

Geitner, Fred K.

(1)

Jackson, Christopher, 1979- author.

(1)

Lewis, P. R. (Peter Rhys), 1945- author.

(1)

Ling, Man Ho, author.

(1)

Modarres, M. (Mohammad), author.

(1)

Riddell, Randy.

(1)

Skovhus, Torben Lund, editor.

(1)

So, Hon Yiu, author.

(1)

Sofronas, Anthony, author.

(1)

Stamatis, D. H., 1947, author.

(1)

Stimson, William A., author.

(1)

Suhir, Ephraim, author.

(1)

Language

(10)

Publication Date

-

(3)

(2)

(1)

(1)

(1)

(1)

(1)

Subject

Analyse des défaillances (Ingénierie)

(4)

Electronic books.

(3)

Equipment Failure Analysis

(2)

TECHNOLOGY & ENGINEERING -- Engineering (General)

(2)

TECHNOLOGY & ENGINEERING -- Reference.

(2)

Accelerated life testing

(1)

Accelerated life testing.

(1)

Air-compressors.

(1)

Compressors -- Maintenance and repair.

(1)

Compressors -- Performance.

(1)

Compressors -- Reliability.

(1)

Corrosion and anti-corrosives.

(1)

Criminalistique.

(1)

(1)

Essais accélérés (Technologie)

(1)

Evidence, Expert

(1)

Evidence, Expert.

(1)

(1)

(1)

Forensic Sciences

(1)

Forensic engineering.

(1)

Forensic sciences.

(1)

Industrial accidents -- Prevention.

(1)

Interconnects (Integrated circuit technology) -- Protection.

(1)

(1)

Microbiologically influenced corrosion.

(1)

(1)

Polymers -- Fracture.

(1)

Probability & Statistics.

(1)

Production engineering

(1)

Production engineering.

(1)

Reliability (Engineering)

(1)

Risk assessment.

(1)

Solder and soldering -- Mechanical properties -- Mathematical models.

(1)

System failures (Engineering)

(1)

TECHNOLOGY & ENGINEERING -- Electronics -- General.

(1)

TECHNOLOGY & ENGINEERING.

(1)

TECHNOLOGY / Electronics / General

(1)

TECHNOLOGY / Engineering / Chemical & Biochemical

(1)

TECHNOLOGY / Industrial Health & Safety

(1)

TECHNOLOGY / Material Science

(1)

Technique de la production.

(1)

accelerated aging.

(1)

forensic science.

(1)

Material Type

Shelf Location

Electronic Library

Taylor Francis E-Book Collection

Wiley E-Book Collection

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1.

Cover image for Failure analysis of microbiologically influenced corrosion

Failure analysis of microbiologically influenced corrosion

Failure analysis of microbiologically influenced corrosion

Author

Eckert, Richard Bruce, editor. Skovhus, Torben Lund, editor.

Preferred Shelf Number

TA418.74

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9780429355479
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Availability

Online Library~1

Available:
Copies:

2.

Cover image for Practical root cause failure analysis : key elements, case studies, and common equipment ... failures.

Practical root cause failure analysis : key elements, case studies, and common equipment ... failures.

Practical root cause failure analysis : key elements, case studies, and common equipment ... failures.

Author

Riddell, Randy.

Preferred Shelf Number

TA169.5

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/e/9781003248675
Taylor & Francis https://www.taylorfrancis.com/books/9781003248675
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Availability

Online Library~1

Available:
Copies:

3.

Cover image for Unique methods for analyzing failures and catastrophic events : a practical guide for engineers

Unique methods for analyzing failures and catastrophic events : a practical guide for engineers

Unique methods for analyzing failures and catastrophic events : a practical guide for engineers

Author

Sofronas, Anthony, author.

Preferred Shelf Number

TA169.5 .S64 2022

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119748281

Format:

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Online Library~1

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4.

Cover image for Avoiding inelastic strains in solder joint interconnections of IC devices

Avoiding inelastic strains in solder joint interconnections of IC devices

Avoiding inelastic strains in solder joint interconnections of IC devices

Author

Suhir, Ephraim, author.

Preferred Shelf Number

TK7874.53 .S84 2021 EB

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9780429460470
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Availability

Online Library~1

Available:
Copies:

5.

Cover image for Accelerated life testing of one-shot devices : data collection and analysis

Accelerated life testing of one-shot devices : data collection and analysis

Accelerated life testing of one-shot devices : data collection and analysis

Author

Balakrishnan, N., 1956- author. Ling, Man Ho, author. So, Hon Yiu, author.

Preferred Shelf Number

TA169.3 .B35 2021

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031

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6.

Cover image for Forensic systems engineering : evaluating operations by discovery

Forensic systems engineering : evaluating operations by discovery

Forensic systems engineering : evaluating operations by discovery

Author

Stimson, William A., author.

Preferred Shelf Number

TA169.5 .S755 2018

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808

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7.

Cover image for Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment

Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment

Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment

Author

Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.

Preferred Shelf Number

TA169.5

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692

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8.

Cover image for Forensic polymer engineering : why polymer products fail in service

Forensic polymer engineering : why polymer products fail in service

Forensic polymer engineering : why polymer products fail in service

Author

Lewis, P. R. (Peter Rhys), 1945- author.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780081010556

Format:

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9.

Cover image for Introduction to risk and failures : tools and methodologies

Introduction to risk and failures : tools and methodologies

Introduction to risk and failures : tools and methodologies

Author

Stamatis, D. H., 1947, author.

Preferred Shelf Number

TA169.5 .S73 2014

Electronic Access

Click here to view.

Format:

Availability

Online Library~1

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10.

Cover image for Compressors how to achieve high reliability & availability

Compressors how to achieve high reliability & availability

Compressors how to achieve high reliability & availability

Author

Bloch, Heinz P., 1933- Geitner, Fred K.

Preferred Shelf Number

ONLINE

Electronic Access

Subscription required

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