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Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
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Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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2. 
Cover image for Optical nonlinearities and instabilities in semiconductors
Optical nonlinearities and instabilities in semiconductors
Author 
Haug, Hartmut.
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ScienceDirect http://www.sciencedirect.com/science/book/9780123329158
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3. 
Cover image for Optical orientation
Optical orientation
Author 
Meier, F. (Felix), 1943- Zakharcheni͡a, Boris Petrovich.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444867414
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