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1. 
Cover image for Low-Power Low-Voltage Sigma-Delta Modulators in Nanometer CMOS
Low-Power Low-Voltage Sigma-Delta Modulators in Nanometer CMOS
Author 
Yao, Libin. author. Steyaert, Michiel. author. Sansen, Willy. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-4140-3
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2. 
Cover image for MEMS Product Engineering Handling the Diversity of an Emerging Technology. Best Practices for Cooperative Development
MEMS Product Engineering Handling the Diversity of an Emerging Technology. Best Practices for Cooperative Development
Author 
Ortloff, Dirk. author. Schmidt, Thilo. author. Hahn, Kai. author. Bieniek, Tomasz. author. Janczyk, Grzegorz. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-7091-0706-5
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3. 
Cover image for The Non-Equilibrium Green's Function Method for Nanoscale Device Simulation
The Non-Equilibrium Green's Function Method for Nanoscale Device Simulation
Author 
Pourfath, Mahdi. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-7091-1800-9
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4. 
Cover image for Three-Dimensional Nanoarchitectures Designing Next-Generation Devices
Three-Dimensional Nanoarchitectures Designing Next-Generation Devices
Author 
Zhou, Weilie. editor. Wang, Zhong Lin. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9822-4
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5. 
Cover image for Theory of Semiconductor Quantum Devices Microscopic Modeling and Simulation Strategies
Theory of Semiconductor Quantum Devices Microscopic Modeling and Simulation Strategies
Author 
Rossi, Fausto. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-10556-2
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6. 
Cover image for Metal-to-Nonmetal Transitions
Metal-to-Nonmetal Transitions
Author 
Redmer, Ronald. editor. Hensel, Friedrich. editor. Holst, Bastian. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-03953-9
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7. 
Cover image for New Trends in Nanotechnology and Fractional Calculus Applications
New Trends in Nanotechnology and Fractional Calculus Applications
Author 
Baleanu, Dumitru. editor. Guvenc, Ziya B. editor. Machado, J. A. Tenreiro. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3293-5
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8. 
Cover image for Introduction to Space Charge Effects in Semiconductors
Introduction to Space Charge Effects in Semiconductors
Author 
Böer, Karl W. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-02236-4
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9. 
Cover image for Embedded Memories for Nano-Scale VLSIs
Embedded Memories for Nano-Scale VLSIs
Author 
Zhang, Kevin. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-88497-4
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10. 
Cover image for Mapping Nanotechnology Innovations and Knowledge Global and Longitudinal Patent and Literature Analysis
Mapping Nanotechnology Innovations and Knowledge Global and Longitudinal Patent and Literature Analysis
Author 
Roco, Mihail. author. Chen, Hsinchun. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-71620-6
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11. 
Cover image for Nanobioelectronics - for Electronics, Biology, and Medicine
Nanobioelectronics - for Electronics, Biology, and Medicine
Author 
Offenhäusser, Andreas. editor. Rinaldi, Ross. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-09459-5
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12. 
Cover image for Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications
Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications
Author 
Shacham-Diamand, Yosi. editor. Osaka, Tetsuya. editor. Datta, Madhav. editor. Ohba, Takayuki. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-95868-2
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13. 
Cover image for Nanometer Technology Designs High-Quality Delay Tests
Nanometer Technology Designs High-Quality Delay Tests
Author 
Tehranipoor, Mohammad. author. Ahmed, Nisar. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-75728-5
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14. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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15. 
Cover image for Nanoscaled Semiconductor-on-Insulator Structures and Devices
Nanoscaled Semiconductor-on-Insulator Structures and Devices
Author 
Hall, Steve. editor. Nazarov, Alexei N. editor. Lysenko, Vladimir S. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-6380-0
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16. 
Cover image for AmIware Hardware Technology Drivers of Ambient Intelligence
AmIware Hardware Technology Drivers of Ambient Intelligence
Author 
Mukherjee, Satyen. editor. Aarts, Ronald M. editor. Roovers, Raf. editor. Widdershoven, Frans. editor. Ouwerkerk, Martin. editor.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-4198-5
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