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1. 
Cover image for Optical properties of semiconductor nanostructures
Optical properties of semiconductor nanostructures
Author 
Sadowski, Marcin L. Potemski, Marek. Grynberg, Marian.
Preferred Shelf Number 
QC611.6.O6 O6613 2000
Format: 
Availability 
Beytepe Library~1
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2. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
Format: 
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Online Library~1
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