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Cover image for Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
Author 
van Schooten, Kipp. author. SpringerLink (Online service)
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ONLINE(332776.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-319-00590-4
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2. 
Cover image for Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine
Author 
Fesenko, Olena. editor. Yatsenko, Leonid. editor. Brodin, Mikhaylo. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332321.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-7675-7
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3. 
Cover image for New Trends in Atomic and Molecular Physics Advanced Technological Applications
New Trends in Atomic and Molecular Physics Advanced Technological Applications
Author 
Mohan, Man. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(334548.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-38167-6
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