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1. 
Cover image for Contactless VLSI Measurement and Testing Techniques
Contactless VLSI Measurement and Testing Techniques
Author 
Sayil, Selahattin. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-69673-7
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2. 
Cover image for Instrumentation, Measurement, Circuits and Systems
Instrumentation, Measurement, Circuits and Systems
Author 
Zhang, Tianbiao. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-27334-6
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3. 
Cover image for Functional Verification Coverage Measurement and Analysis
Functional Verification Coverage Measurement and Analysis
Author 
Piziali, Andrew. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/b117979
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4. 
Cover image for Supportability engineering handbook implementation, measurement, and management
Supportability engineering handbook implementation, measurement, and management
Author 
Jones, James V.
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5. 
Cover image for Compact Models and Measurement Techniques for High-Speed Interconnects
Compact Models and Measurement Techniques for High-Speed Interconnects
Author 
Sharma, Rohit. author. Chakravarty, Tapas. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-1071-3
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6. 
Cover image for Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Author 
Im, Seongil. author. Chang, Youn-Gyoung. author. Kim, Jae Hoon. author. SpringerLink (Online service)
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ONLINE(336233.1)
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http://dx.doi.org/10.1007/978-94-007-6392-0
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7. 
Cover image for Quantitative measurements for logistics
Quantitative measurements for logistics
Author 
Frohne, Philip T. SOLE--The International Society of Logistics.
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8. 
Cover image for Instrumentation design studies
Instrumentation design studies
Author 
Doebelin, Ernest O.
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