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1. 
Cover image for Microelectronic Test Structures for CMOS Technology
Microelectronic Test Structures for CMOS Technology
Author 
Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9377-9
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2. 
Cover image for Integrated Circuit Test Engineering Modern Techniques
Integrated Circuit Test Engineering Modern Techniques
Author 
Grout, Ian A. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-84628-173-3
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3. 
Cover image for Test and Diagnosis for Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
Author 
Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-8297-1
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4. 
Cover image for Test Pattern Generation using Boolean Proof Engines
Test Pattern Generation using Boolean Proof Engines
Author 
Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-2360-5
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5. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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6. 
Cover image for Oscillation-Based Test in Mixed-Signal Circuits
Oscillation-Based Test in Mixed-Signal Circuits
Author 
Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/1-4020-5315-0
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7. 
Cover image for System-Level Validation High-Level Modeling and Directed Test Generation Techniques
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
Author 
Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)
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ONLINE(331265.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-1359-2
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8. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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ONLINE(335669.1)
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http://dx.doi.org/10.1007/978-90-481-9644-9
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9. 
Cover image for High Quality Test Pattern Generation and Boolean Satisfiability
High Quality Test Pattern Generation and Boolean Satisfiability
Author 
Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9976-4
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10. 
Cover image for Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Built-in-Self-Test and Digital Self-Calibration for RF SoCs
Author 
Bou-Sleiman, Sleiman. author. Ismail, Mohammed. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-9548-3
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11. 
Cover image for Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
Author 
Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9398-1
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12. 
Cover image for Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
Author 
Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/978-90-481-9725-5
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13. 
Cover image for Digital System Test and Testable Design Using HDL Models and Architectures
Digital System Test and Testable Design Using HDL Models and Architectures
Author 
Navabi, Zainalabedin. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7548-5
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14. 
Cover image for Efficient Test Methodologies for High-Speed Serial Links
Efficient Test Methodologies for High-Speed Serial Links
Author 
Hong, Dongwoo. author. Cheng, Kwang-Ting. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3443-4
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15. 
Cover image for RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
Author 
Liu, Ai-Qun. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-46262-2
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16. 
Cover image for Power-Aware Testing and Test Strategies for Low Power Devices
Power-Aware Testing and Test Strategies for Low Power Devices
Author 
Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0928-2
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17. 
Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author 
Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.
Preferred Shelf Number 
ONLINE
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http://dx.doi.org/10.1007/978-1-4419-0938-1
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18. 
Cover image for Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
Author 
Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-6488-3
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19. 
Cover image for CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Test
Author 
Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8363-1
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20. 
Cover image for Design of Systems on a Chip: Design and Test
Design of Systems on a Chip: Design and Test
Author 
Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-32500-X
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21. 
Cover image for The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
Author 
Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-34609-0
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22. 
Cover image for System-level Test and Validation of Hardware/Software Systems
System-level Test and Validation of Hardware/Software Systems
Author 
Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-84628-145-8
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23. 
Cover image for Product maturity. 2, Principles and illustrations
Product maturity. 2, Principles and illustrations
Author 
Bayle, Franck, author.
Preferred Shelf Number 
TA169
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988342
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24. 
Cover image for Product maturity. 1, Theoretical principals and industrial applications
Product maturity. 1, Theoretical principals and industrial applications
Author 
Bayle, Franck, author.
Preferred Shelf Number 
TA169
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119902232
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25. 
Cover image for Systems engineering : principles and practice
Systems engineering : principles and practice
Author 
Kossiakoff, Alexander, 1914-2005, author. Seymour, Samuel J., author. Flanigan, David A., author. Biemer, Steven M., author.
Preferred Shelf Number 
TA168 .K68 2020
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119516699
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