Cover image for VLSI test principles and architectures design for testability
Title:
VLSI test principles and architectures design for testability
Author:
Wang, Laung-Terng.
ISBN:
9780080474793
Publication Information:
Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.
Physical Description:
1 online resource (xxx, 777 p.) : ill.
Series:
The Morgan Kaufmann series in systems on silicon
Series Title:
The Morgan Kaufmann series in systems on silicon
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