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1. 
Cover image for VLSI test principles and architectures design for testability
VLSI test principles and architectures design for testability
Author 
Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.
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ScienceDirect http://www.sciencedirect.com/science/book/9780123705976
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2. 
Cover image for Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
Author 
Allen, Jonathan, 1934- Leighton, Frank Thomson. Massachusetts Institute of Technology. Microsystems Research Center. MIT Conference on Advanced Research in VLSI (5th : 1988 : Cambridge, Mass.)
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Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833
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3. 
Cover image for Logic testing and design for testability
Logic testing and design for testability
Author 
Fujiwara, Hideo.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264
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