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1. 
Cover image for Mapping Innovation The Discipline of Building Opportunity across Value Chains
Mapping Innovation The Discipline of Building Opportunity across Value Chains
Author 
Anis, Mohab. author. Chawky, Sarah. author. Abdel Halim, Aya. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-030-93627-3
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2. 
Cover image for Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Author 
Abu-Rahma, Mohamed H. author. Anis, Mohab. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331282.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-1749-1
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Availability 
Online Library~1
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