Title:
Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Author:
Abu-Rahma, Mohamed H. author.
ISBN:
9781461417491
Physical Description:
XVI, 172 p. online resource.
Added Author:
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-1-4614-1749-1Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 331282-1001 | ONLINE(331282.1) | Searching... | Searching... |