Title:
CMOS Test and Evaluation A Physical Perspective
Author:
Bhushan, Manjul. author.
ISBN:
9781493913497
Edition:
1st ed. 2015.
Physical Description:
XIII, 424 p. 338 illus. online resource.
Contents:
Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.
Added Author:
Added Corporate Author:
Electronic Access:
https://doi.org/10.1007/978-1-4939-1349-7Copies:
Available:*
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|---|---|---|---|---|---|
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