Title:
Characterization in silicon processing
Author:
Strausser, Yale.
ISBN:
9781606501115
9781606501092
Publication Information:
New York, NY : Momentum Press, 2010.
Physical Description:
1 online resource (xv, 240 p.) : ill.
Series:
Materials characterization series
Series Title:
Materials characterization series
Electronic Access:
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=501143Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 280190-1001 | ONLINE | Searching... | Searching... |