![Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies Cover image for Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies](/client/assets/5.0.0.9/ctx//client/images/no_image.png)
Title:
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author:
Bosio, Alberto. author.
ISBN:
9781441909381
Edition:
1.
Physical Description:
online resource.
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-1-4419-0938-1Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
---|---|---|---|---|---|
Searching... | E-Book | 172103-2001 | ONLINE | Searching... | Searching... |