Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition

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Title:

Author:

Sachdev, Manoj. editor.

ISBN:

9780387465470

Physical Description:

XXI, 328 p. online resource.

Series:

Frontiers in Electronic Testing, 34

Series Title:

Frontiers in Electronic Testing, 0929-1296 ; 34

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	166351-2001	ONLINE	Searching... Unknown	Searching... Unavailable