Cover image for RF and microwave modeling and measurement techniques for field effect transistors
Title:
RF and microwave modeling and measurement techniques for field effect transistors
Author:
Gao, Jianjun, 1968-
ISBN:
9781613442869

9781613530900
Publication Information:
Raleigh, NC : SciTech Pub., c2010.
Physical Description:
1 online resource (x, 339 p.) : ill.
Subject Term:
Field-effect transistors -- Testing.

Compound semiconductors -- Testing.

Field-effect transistors -- Mathematical models.

Compound semiconductors -- Mathematical models.

Microwave measurements.

Radio measurements.
Added Corporate Author:
Knovel (Firm)
Electronic Access:
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541
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