Title:
Journey to data quality
Author:
Lee, Yang W.
ISBN:
9780262256544
Publication Information:
Cambridge, Mass. : MIT Press, c2006.
Physical Description:
1 online resource (xii, 226 p.) : ill.
Added Author:
Electronic Access:
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267297Copies:
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Searching... | E-Book | 219993-1001 | ONLINE | Searching... | Searching... |