Title:
Reliability of Microtechnology Interconnects, Devices and Systems
Author:
Liu, Johan. author.
ISBN:
9781441957603
Edition:
1.
Physical Description:
XIII, 204p. 50 illus. online resource.
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-1-4419-5760-3Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 172420-2001 | ONLINE | Searching... | Searching... |