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Cover image for Semiconductor memories technology, testing, and reliability
Semiconductor memories technology, testing, and reliability
Author 
Sharma, Ashok K. IEEE Solid-State Circuits Council.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264189
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2. 
Cover image for Advanced semiconductor memories architectures, designs, and applications
Advanced semiconductor memories architectures, designs, and applications
Author 
Sharma, Ashok K.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265562
Format: 
Availability 
Online Library~1
Available:
Copies: