Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

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Title:

Author:

Shen, Ruijing. author.

ISBN:

9781461407881

Physical Description:

XXXI, 305p. 104 illus. online resource.

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Library	Material Type	Item Barcode	Shelf Number	Status	Item Holds
Searching... Online Library	E-Book	173778-2001	ONLINE	Searching... Unknown	Searching... Unavailable