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1. 
Cover image for MEMS Reliability
MEMS Reliability
Author 
Hartzell, Allyson L. author. da Silva, Mark G. author. Shea, Herbert R. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6018-4
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Cover image for Network Reliability and Resilience
Network Reliability and Resilience
Author 
Gertsbakh, Ilya. author. Shpungin, Yoseph. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-22374-7
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3. 
Cover image for Innovations in Power Systems Reliability
Innovations in Power Systems Reliability
Author 
Anders, George. editor. Vaccaro, Alfredo. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-088-5
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4. 
Cover image for Applied Nonparametric Statistics in Reliability
Applied Nonparametric Statistics in Reliability
Author 
Gámiz, M. Luz. author. Kulasekera, K. B. author. Limnios, Nikolaos. author. Lindqvist, Bo Henry. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-118-9
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5. 
Cover image for Software Reliability Assessment with OR Applications
Software Reliability Assessment with OR Applications
Author 
Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-204-9
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6. 
Cover image for Fatigue and Fracture Reliability Engineering
Fatigue and Fracture Reliability Engineering
Author 
Xiong, J.J. author. Shenoi, R.A. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-218-6
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7. 
Cover image for Semiconductor Power Devices Physics, Characteristics, Reliability
Semiconductor Power Devices Physics, Characteristics, Reliability
Author 
Lutz, Josef. author. Schlangenotto, Heinrich. author. Scheuermann, Uwe. author. De Doncker, Rik. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-11125-9
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8. 
Cover image for Stochastic Processes with Applications to Reliability Theory
Stochastic Processes with Applications to Reliability Theory
Author 
Nakagawa, Toshio. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-274-2
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9. 
Cover image for Reliability of Microtechnology Interconnects, Devices and Systems
Reliability of Microtechnology Interconnects, Devices and Systems
Author 
Liu, Johan. author. Salmela, Olli. author. Sarkka, Jussi. author. Morris, James E. author. Tegehall, Per-Erik. author.
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http://dx.doi.org/10.1007/978-1-4419-5760-3
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10. 
Cover image for Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Author 
Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-310-7
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11. 
Cover image for Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
Reliability and Safety of Complex Technical Systems and Processes Modeling – Identification – Prediction - Optimization
Author 
Kołowrocki, Krzysztof. author. Soszyńska-Budny, Joanna. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-694-8
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12. 
Cover image for Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Author 
Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6217-1
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