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1. 
Cover image for Analog IC Reliability in Nanometer CMOS
Analog IC Reliability in Nanometer CMOS
Author 
Maricau, Elie. author. Gielen, Georges. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331961.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6163-0
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2. 
Cover image for Lead Free Solder Mechanics and Reliability
Lead Free Solder Mechanics and Reliability
Author 
Pang, John Hock Lye. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0463-7
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3. 
Cover image for Solid State Lighting Reliability Components to Systems
Solid State Lighting Reliability Components to Systems
Author 
van Driel, W.D. editor. Fan, X.J. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331314.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-3067-4
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4. 
Cover image for Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
Author 
Tehranipoor, Mohammad. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-74747-7
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5. 
Cover image for Reliability, Availability and Serviceability of Networks-on-Chip
Reliability, Availability and Serviceability of Networks-on-Chip
Author 
Cota, Érika. author. Morais Amory, Alexandre. author. Soares Lubaszewski, Marcelo. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0791-1
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6. 
Cover image for Power Electronic Packaging Design, Assembly Process, Reliability and Modeling
Power Electronic Packaging Design, Assembly Process, Reliability and Modeling
Author 
Liu, Yong. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-1053-9
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7. 
Cover image for Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architectures
Author 
Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6217-1
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8. 
Cover image for Securing Electricity Supply in the Cyber Age Exploring the Risks of Information and Communication Technology in Tomorrow's Electricity Infrastructure
Securing Electricity Supply in the Cyber Age Exploring the Risks of Information and Communication Technology in Tomorrow's Electricity Infrastructure
Author 
Lukszo, Zofia. editor. Deconinck, Geert. editor. Weijnen, Margot P. C. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-3594-3
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9. 
Cover image for Fault-Tolerant Design
Fault-Tolerant Design
Author 
Dubrova, Elena. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331297.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-2113-9
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10. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335669.1)
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9644-9
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