Cover image for Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Title:
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Author:
Shen, Ruijing. author.
ISBN:
9781461407881
Physical Description:
XXXI, 305p. 104 illus. online resource.
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E-Book 173778-2001 ONLINE
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