Cover image for System-on-chip test architectures nanometer design for testability
Title:
System-on-chip test architectures nanometer design for testability
Author:
Wang, Laung-Terng.
ISBN:
9780123739735

9780080556802
Publication Information:
Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Physical Description:
1 online resource (xxxvi, 856 p.) : ill.
Series:
The Morgan Kaufmann series in systems on silicon
Series Title:
The Morgan Kaufmann series in systems on silicon
Subject Term:
Systems on a chip -- Testing.

Integrated circuits -- Very large scale integration -- Testing.

Integrated circuits -- Very large scale integration -- Design.
Added Author:
Wang, Laung-Terng.

Stroud, Charles E.

Touba, Nur A.
Electronic Access:
ScienceDirect http://www.sciencedirect.com/science/book/9780123739735
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