Cover image for LSI/VLSI testability design
Title:
LSI/VLSI testability design
Author:
Tsui, Frank F.
ISBN:
9780070653412
Publication Information:
New York : McGraw-Hill, 1987.
Physical Description:
xii, 702 s.
Holds:
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Book 7.2/12/592377 TH 7874 T78 1987
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