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1. 
Cover image for Amplitude modulation atomic force microscopy
Amplitude modulation atomic force microscopy
Author 
Castro García, Ricardo. Wiley InterScience (Online service)
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Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527632183
Books24x7 http://www.books24x7.com/marc.asp?bookid=43158
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2. 
Cover image for Electrochemical nanotechnology in-situ local probe techniques at electrochemical interfaces
Electrochemical nanotechnology in-situ local probe techniques at electrochemical interfaces
Author 
Lorenz, W. J. Plieth, W. (Waldfried) International Union of Pure and Applied Chemistry. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481756
John Wiley http://dx.doi.org/10.1002/9783527612154
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/39117390.html
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3. 
Cover image for Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
Author 
Magonov, Sergei N. Whangbo, Myung-Hwan. Wiley InterScience (Online service)
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527615117
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