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1. 
Cover image for Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Author 
Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331478.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-4337-7
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2. 
Cover image for Handbook of Technical Diagnostics Fundamentals and Application to Structures and Systems
Handbook of Technical Diagnostics Fundamentals and Application to Structures and Systems
Author 
Czichos, Horst. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333141.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-25850-3
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3. 
Cover image for Evaluating Measurement Accuracy A Practical Approach
Evaluating Measurement Accuracy A Practical Approach
Author 
Rabinovich, Semyon G. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332097.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6717-5
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4. 
Cover image for Computational Electromagnetics and Model-Based Inversion A Modern Paradigm for Eddy-Current Nondestructive Evaluation
Computational Electromagnetics and Model-Based Inversion A Modern Paradigm for Eddy-Current Nondestructive Evaluation
Author 
Sabbagh, Harold A. author. Murphy, R. Kim. author. Sabbagh, Elias H. author. Aldrin, John C. author. Knopp, Jeremy S. author.
Preferred Shelf Number 
ONLINE(330843.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-8429-6
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