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1. 
Cover image for Extreme Statistics in Nanoscale Memory Design
Extreme Statistics in Nanoscale Memory Design
Author 
Singhee, Amith. editor. Rutenbar, Rob A. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-6606-3
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2. 
Cover image for Introduction to Engineering Statistics and Lean Sigma Statistical Quality Control and Design of Experiments and Systems
Introduction to Engineering Statistics and Lean Sigma Statistical Quality Control and Design of Experiments and Systems
Author 
Allen, Theodore T. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-84996-000-7
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3. 
Cover image for Information Theoretic Learning Renyi's Entropy and Kernel Perspectives
Information Theoretic Learning Renyi's Entropy and Kernel Perspectives
Author 
Principe, Jose C. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-1570-2
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Online Library~1
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