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Cover image for RF and microwave modeling and measurement techniques for field effect transistors
RF and microwave modeling and measurement techniques for field effect transistors
Author 
Gao, Jianjun, 1968- Knovel (Firm)
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2. 
Cover image for Defects in microelectronic materials and devices
Defects in microelectronic materials and devices
Author 
Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.
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3. 
Cover image for The RF transmission systems handbook
The RF transmission systems handbook
Author 
Whitaker, Jerry C.
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