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Cover image for New Trends in Image Analysis and Processing – ICIAP 2019 ICIAP International Workshops, BioFor, PatReCH, e-BADLE, DeepRetail, and Industrial Session, Trento, Italy, September 9–10, 2019, Revised Selected Papers
New Trends in Image Analysis and Processing – ICIAP 2019 ICIAP International Workshops, BioFor, PatReCH, e-BADLE, DeepRetail, and Industrial Session, Trento, Italy, September 9–10, 2019, Revised Selected Papers
Author 
Cristani, Marco. editor. (orcid)0000-0002-0523-6042 Prati, Andrea. editor. (orcid)0000-0002-1211-529X Lanz, Oswald. editor. (orcid)0000-0003-4793-4276 Messelodi, Stefano. editor. (orcid)0000-0002-4673-9607 Sebe, Nicu. editor. (orcid)0000-0002-6597-7248
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https://doi.org/10.1007/978-3-030-30754-7
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Cover image for Single-atom nanoelectronics
Single-atom nanoelectronics
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Prati, Enrico. Shinada, Takahiro.
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Distributed by publisher. Purchase or institutional license may be required for access.
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