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Language: English

Author

(2)

Beck, André T., author.

(1)

Beichelt, Frank, 1942, author.

(1)

Benaroya, Haym, 1954- author.

(1)

Bender, Emmanuel (Carl), author.

(1)

Bensoussan, Alain A., author.

(1)

Bernstein, Joseph B., author.

(1)

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)

(1)

(1)

(1)

Dhillon, B. S. (Balbir S.), 1947, author.

(1)

Eid, Mohamed, author.

(1)

El Hami, Abdelkhalak, author.

(1)

Gaonkar, Rajesh S. Prabhu, editor.

(1)

Grouchko, Daniel.

(1)

Han, Seon Mi, author.

(1)

John Wiley & Sons.

(1)

Kaminskiy, Mark, 1946, author.

(1)

Kaufmann, A. (Arnold), 1911-

(1)

Klochkov, Yury, editor.

(1)

Kumar, Akshay, editor.

(1)

Melchers, R. E. (Robert E.), 1945- author.

(1)

Misra, Krishna B., 1943-

(1)

Nagurka, Mark L., author.

(1)

Rai, Rajiv Nandan, author.

(1)

Ram, Mangey, editor.

(1)

Sharma, Garima, author.

(1)

(1)

Singpurwalla, Nozer D.

(1)

Tittmann, Peter.

(1)

Tsokos, Chris P.

(1)

United States. Air Force. Office of Scientific Research.

(1)

University of South Florida.

(1)

Ushakov, I. A. (Igorʹ Alekseevich)

(1)

Wiley InterScience (Online service)

(1)

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Subject

Reliability (Engineering) -- Mathematical models.

(13)

Electronic books.

(4)

Fiabilité -- Modèles mathématiques.

(3)

(3)

Reliability (Engineering)

(3)

TECHNOLOGY & ENGINEERING.

(3)

(2)

Human engineering.

(2)

Reliability (Engineering) -- Mathematical models

(2)

Risk assessment -- Mathematical models.

(2)

Airplanes -- Maintenance and repair -- Quality control.

(1)

Bayesian statistical decision theory -- Congresses.

(1)

Bayesian statistical decision theory.

(1)

Constructions -- Stabilité.

(1)

Electric power-plants -- Maintenance and repair -- Quality control.

(1)

Errors -- Prevention.

(1)

(1)

(1)

(1)

Güvenilirlik (Mühendislik) -- Matematiksel modeller.

(1)

Human-machine systems -- Reliability.

(1)

Human-machine systems.

(1)

MODELE METHEMATIQUE.

(1)

(1)

(1)

Microelectronics -- Reliability.

(1)

Microelectronics.

(1)

Microélectronique -- Fiabilité.

(1)

Plant maintenance

(1)

Plant maintenance.

(1)

(1)

(1)

Quality Control.

(1)

Reliability (Engineering) -- Mathematical models -- Congresses.

(1)

Reliability (Engineering) -- Mathematics.

(1)

Reliability (Engineering) -- Statistical methods.

(1)

Risk management -- Mathematical models.

(1)

Risk yönetimi -- Matematiksel modeller.

(1)

(1)

Science -- Data processing.

(1)

(1)

Structural stability

(1)

Structural stability.

(1)

System analysis -- Mathematical models.

(1)

TECHNOLOGY & ENGINEERING -- Civil -- General.

(1)

TECHNOLOGY / Engineering / Industrial

(1)

TECHNOLOGY / Manufacturing

(1)

TECHNOLOGY / Operations Research

(1)

Transportation -- Safety measures.

(1)

Transportation engineering.

(1)

Usines -- Entretien.

(1)

fiabilité système.

(1)

(1)

Material Type

Shelf Location

Beytepe General Collection

Electronic Library

Taylor Francis E-Book Collection

Wiley E-Book Collection

Library

Beytepe Library

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1.

Cover image for The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

Author

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780127021010

Format:

Availability

Online Library~1

Available:
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2.

Cover image for System reliability analysis : transition from binary to multi-state models

System reliability analysis : transition from binary to multi-state models

System reliability analysis : transition from binary to multi-state models

Author

Kumar, Akshay, editor. Ram, Mangey, editor. Gaonkar, Rajesh S. Prabhu, editor. Klochkov, Yury, editor.

Preferred Shelf Number

TA169

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9781003546214
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

Format:

Availability

Online Library~1

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3.

Cover image for Reliability prediction for microelectronics

Reliability prediction for microelectronics

Reliability prediction for microelectronics

Author

Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.

Preferred Shelf Number

TK7874

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961

Format:

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Online Library~1

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4.

Cover image for Reliability-based modeling of system performance

Reliability-based modeling of system performance

Reliability-based modeling of system performance

Author

El Hami, Abdelkhalak, author. Eid, Mohamed, author.

Preferred Shelf Number

TA169 .H36 2023

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781394236695

Format:

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5.

Cover image for Advanced techniques for maintenance modeling and reliability analysis of repairable systems

Advanced techniques for maintenance modeling and reliability analysis of repairable systems

Advanced techniques for maintenance modeling and reliability analysis of repairable systems

Author

Sharma, Garima, author. Rai, Rajiv Nandan, author.

Preferred Shelf Number

TA169 .S53 2023

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781394174836

Format:

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6.

Cover image for Structural reliability analysis and prediction

Structural reliability analysis and prediction

Structural reliability analysis and prediction

Author

Melchers, R. E. (Robert E.), 1945- author. Beck, André T., author.

Preferred Shelf Number

TA656.5 .M45 2018

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119266105

Format:

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7.

Cover image for Probabilistic models for dynamical systems

Probabilistic models for dynamical systems

Probabilistic models for dynamical systems

Author

Benaroya, Haym, 1954- author. Han, Seon Mi, author. Nagurka, Mark L., author.

Preferred Shelf Number

TA169 B463 2013

Format:

Availability

Beytepe Library~1

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8.

Cover image for Reliability models for engineers and scientists

Reliability models for engineers and scientists

Reliability models for engineers and scientists

Author

Kaminskiy, Mark, 1946, author.

Preferred Shelf Number

TA169 .K36 2013

Electronic Access

Click here to view.

Format:

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9.

Cover image for Probabilistic reliability models

Probabilistic reliability models

Probabilistic reliability models

Author

Ushakov, I. A. (Igorʹ Alekseevich)

Preferred Shelf Number

ONLINE

Electronic Access

Ebook Library Click here to view book
Available by subscription from Safari Books Online
Wiley InterScience http://dx.doi.org/10.1002/9781118370742
Books24x7 http://www.books24x7.com/marc.asp?bookid=49723
Volltext http://proquest.tech.safaribooksonline.de/9781118370766

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10.

Cover image for Reliability and maintenance : networks and systems

Reliability and maintenance : networks and systems

Reliability and maintenance : networks and systems

Author

Beichelt, Frank, 1942, author. Tittmann, Peter.

Preferred Shelf Number

TA169 .B45 2012

Electronic Access

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11.

Cover image for Human reliability, error, and human factors in engineering maintenance : with reference to aviation and power generation

Human reliability, error, and human factors in engineering maintenance : with reference to aviation and power generation

Human reliability, error, and human factors in engineering maintenance : with reference to aviation and power generation

Author

Dhillon, B. S. (Balbir S.), 1947, author.

Preferred Shelf Number

TA167 .D468 2009

Electronic Access

Click here to view.

Format:

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12.

Cover image for Human reliability and error in transportation systems

Human reliability and error in transportation systems

Human reliability and error in transportation systems

Author

Dhillon, B. S.

Preferred Shelf Number

TA1145 D45 2007

Format:

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