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1. 
Cover image for Handheld Total Chemical and Biological Analysis Systems Bridging NMR, Digital Microfluidics, and Semiconductors
Handheld Total Chemical and Biological Analysis Systems Bridging NMR, Digital Microfluidics, and Semiconductors
Author 
Lei, Ka-Meng. author. Mak, Pui-In. author. Law, Man-Kay. author. Martins, Rui Paulo. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-67825-2
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2. 
Cover image for Trap level spectroscopy in amorphous semiconductors
Trap level spectroscopy in amorphous semiconductors
Author 
Mikla, Victor I.
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ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123847157
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3. 
Cover image for Properties of semiconductor alloys group-IV, III-V and II-VI semiconductors
Properties of semiconductor alloys group-IV, III-V and II-VI semiconductors
Author 
Adachi, Sadao, 1950-
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ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9780470744383
MyiLibrary, Table of contents http://www.myilibrary.com?id=212352&ref=toc
http://onlinelibrary.wiley.com/book/10.1002/9780470744383
http://site.ebrary.com/lib/alltitles/Doc?id=10297966
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4. 
Cover image for Properties of group-IV, III-V and II-VI semiconductors
Properties of group-IV, III-V and II-VI semiconductors
Author 
Adachi, Sadao, 1950- John Wiley & Sons.
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John Wiley http://dx.doi.org/10.1002/0470090340
http://www3.interscience.wiley.com/cgi-bin/bookhome/111082133
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5. 
Cover image for Handbook of semiconductor technology
Handbook of semiconductor technology
Author 
Jackson, Kenneth A. Schröter, W. (Wolfgang)
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Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Knovel http://app.knovel.com/web/toc.v/cid:kpHSTV0003
John Wiley http://dx.doi.org/10.1002/9783527619290
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43030635.html
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6. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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