Limit Search Results
Author
Publication Date
-
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
3 Results Found Subscribe to search results
000DEFAULT
Print
1. 
Cover image for Electronic design automation synthesis, verification, and test
Electronic design automation synthesis, verification, and test
Author 
Wang, Laung-Terng. Chang, Yao-Wen. Cheng, Kwang-Ting, 1961-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123743640
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for System-on-chip test architectures nanometer design for testability
System-on-chip test architectures nanometer design for testability
Author 
Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123739735
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for VLSI test principles and architectures design for testability
VLSI test principles and architectures design for testability
Author 
Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780123705976
Format: 
Availability 
Online Library~1
Available:
Copies: